Fundamentals of atomic force microscopy,Part 1:Foundations
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TextLanguage: English Series: Lessons from Nanoscience:Alecture note series. VOL:4 Publication details: New Jersey World Scientific 2016 Description: XV, 324p.pbkISBN: 9789814630351Subject(s): PHYSICS | MICROSCOPYDDC classification: 537.533.35
| Item type | Current library | Call number | Status | Date due | Barcode |
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Book
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NISER LIBRARY | 537.533.35 REI-F (Browse shelf(Opens below)) | R (REFERENCE) | 16884 | |
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Book
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NISER LIBRARY | 537.533.35 REI-F (Browse shelf(Opens below)) | Available | 16885 |
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| 537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis | 537.533.35 REE-E Electron microprobe analysis and scanning electron microscopy in geology | 537.533.35 REE-E Electron microprobe analysis and scanning electron microscopy in geology | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science | 537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science |
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