Fundamentals of atomic force microscopy,Part 1:Foundations

By: Reifenberger, Ronald GMaterial type: Text

TextLanguage: English Series: Lessons from Nanoscience:Alecture note series. VOL:4 Publication details: New Jersey World Scientific 2016 Description: XV, 324p.pbkISBN: 9789814630351Subject(s): PHYSICS | MICROSCOPYDDC classification: 537.533.35

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	537.533.35 REI-F (Browse shelf(Opens below))	R (REFERENCE)		16884
Book	NISER LIBRARY	537.533.35 REI-F (Browse shelf(Opens below))	Available		16885

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