Atomic force microscopy : understanding basic modes and advanced applications
Material type:
TextLanguage: English Publication details: New Jersey Wiley 2012 Description: xxii, 464 p. pbkISBN: 9780470638828Subject(s): PHYSICS | ATOMIC FORCE MICROSCOPYDDC classification: 537.533.35
| Item type | Current library | Call number | Status | Date due | Barcode |
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Book
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NISER LIBRARY | 537.533.35 HAU-A (Browse shelf(Opens below)) | Available | 16942 | |
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Book
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NISER LIBRARY | 537.533.35 HAU-A (Browse shelf(Opens below)) | R (REFERENCE) | 16775 |
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| 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 EGE-P Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) | 537.533.35 GOL-S Scanning electron microscopy and x-ray microanalysis | 537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications | 537.533.35 HAU-A Atomic force microscopy : understanding basic modes and advanced applications | 537.533.35 MOR-N Noncontact atomic force microscopy: vol.2 | 537.533.35 MOR-N Noncontact atomic force microscopy: vol.2 |
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