Atomic force microscopy : understanding basic modes and advanced applications

By: Haugstad, GregMaterial type: Text

TextLanguage: English Publication details: New Jersey Wiley 2012 Description: xxii, 464 p. pbkISBN: 9780470638828Subject(s): PHYSICS | ATOMIC FORCE MICROSCOPYDDC classification: 537.533.35

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	537.533.35 HAU-A (Browse shelf(Opens below))	Available		16942
Book	NISER LIBRARY	537.533.35 HAU-A (Browse shelf(Opens below))	R (REFERENCE)		16775

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