Sequential analysis: tests and confidence intervals

By: Siegmund, DavidMaterial type: Text

TextLanguage: English Series: Springer series in statisticsPublication details: New York Springer science 1985 Description: xi, 272p. pbkISBN: 9781441930750Subject(s): MATHEMATICS | SEQUENTIAL ANALYSIS | STATISTICSDDC classification: 519.244

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	519.244 SIE-S (Browse shelf(Opens below))	R (REFERENCE)		14408

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