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Sequential analysis: tests and confidence intervals

Siegmund, David

Sequential analysis: tests and confidence intervals - New York Springer science 1985 - xi, 272p. pbk. - Springer series in statistics .

ISBN: 9781441930750

Subjects--Topical Terms:
MATHEMATICS
SEQUENTIAL ANALYSIS
STATISTICS

Dewey Class. No.: 519.244 / SIE-S

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