Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer

By: Alford, TLContributor(s): Feldman, LC [Auth.]Material type: Text

TextLanguage: English Publication details: New York Springer 2007 Description: xiv,336pISBN: 9780387292601Subject(s): FILM ANALYSIS | NANOSCALEDDC classification: 620.3

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	620.3 ALF-F (Browse shelf(Opens below))	Available		21309
Book	NISER LIBRARY	620.3 ALF-F (Browse shelf(Opens below))	R (REFERENCE)		5848

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