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Fundamentals of nanoscale film analysis

Alford, TL

Fundamentals of nanoscale film analysis Terry L. Alford, Leonard C. Feldman and James W. Mayer - New York Springer 2007 - xiv,336p.

Ref. sec

ISBN: 9780387292601

Subjects--Topical Terms:
FILM ANALYSIS
NANOSCALE

Dewey Class. No.: 620.3 / ALF-F

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