| 000 | 00505cam a22001934a 4500 | ||
|---|---|---|---|
| 999 |
_c31342 _d31342 |
||
| 005 | 20200817163113.0 | ||
| 008 | 000215s2001 nyua b 000 0 eng | ||
| 020 | _a9780471241416 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a539.216 _bAUC-I |
||
| 100 | _aEdited by- Auciello, Orlando | ||
| 245 | 0 | 0 | _aIn situ real time characterization of thin films |
| 260 |
_aNew York _bWiley _c2001 |
||
| 300 | _axi, 263p. | ||
| 650 | 0 | _aTHIN FLIMS | |
| 700 | 1 | _aKrauss, Alan R. | |
| 942 | _cBK | ||