| 000 | 00644cam a2200229 i 4500 | ||
|---|---|---|---|
| 005 | 20161130154321.0 | ||
| 008 | 780901s1978 nyu b 001 0 eng | ||
| 010 | _a 78010478 | ||
| 020 | _a0824766652 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 | 0 | 0 |
_a519.248 _bBAI-S |
| 100 | 1 | _aBain, Lee J. | |
| 245 | 1 | 0 | _aStatistical analysis of reliability and life-testing models: theory and methods |
| 260 |
_aNew York _bM. Dekker _c1978 |
||
| 300 | _axii, 450p. HB. | ||
| 440 | _aStatistics: textbooks and monographs, vol. 24 | ||
| 650 | 0 | _aMATHEMATICS | |
| 650 | 0 | _aRELIABILITY | |
| 650 | 0 | _aSTATISTICS | |
| 942 | _cBK | ||
| 999 |
_c24950 _d24950 |
||