| 000 | 00640nam a2200205Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9780387286679 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a543.456 _bKAL-S |
||
| 100 | _aKalinin, S | ||
| 245 |
_aScanning probe microscopy = Electrical and electromechanical phenomena at the nanoscale vol.2 _cSergei Kalinin and Alexei Gruverman |
||
| 260 |
_aNew work _bSpringer _c2007 |
||
| 300 | _a980p. | ||
| 500 | _aRef. sec | ||
| 650 | _aKELVIN PROBE FORCE MICROSCOPY | ||
| 650 | _aSCANNING CAPACITANCE MICROSCOPY | ||
| 700 |
_aGruverman ,Alexei _4Auth. |
||
| 942 | _cBK | ||
| 999 |
_c2261 _d2261 |
||