| 000 | 00727nmm a2200229Ia 4500 | ||
|---|---|---|---|
| 008 | 140908s9999 xx 000 0 und d | ||
| 020 | _a9781441965332, 978-1-4419-6533-2 | ||
| 040 | _aNISER LIBRARY | ||
| 041 | _aEnglish | ||
| 082 |
_a620.11, _b23 |
||
| 245 | _aAdvanced Computing in Electron Microscopy | ||
| 260 |
_aBoston, MA _bSpringer US _c2010. |
||
| 500 | _aPhysics and Astronomy (Springer-11651) | ||
| 650 | _aCharacterization and Evaluation of Materials | ||
| 650 | _aComputer engineering | ||
| 650 | _aElectrical Engineering | ||
| 650 | _aMaterials Science | ||
| 650 | _aSurfaces (Physics) | ||
| 700 | _aKirkland, Earl J., author. | ||
| 856 | _uhttp://dx.doi.org/10.1007/978-1-4419-6533-2 | ||
| 942 | _cEB | ||
| 999 |
_c15361 _d15361 |
||