Elements of x-ray diffraction
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TextLanguage: English Publication details: New Jersy PH 2001 Edition: 3rd edDescription: xv, 678pISBN: 9780201610918Subject(s): CHEMISTRY | CRYSTAL QUALITY | DIFFRACTOMETER MEASUREMENTS | STRESS MEASUREMENTDDC classification: 548.73
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NISER LIBRARY | 548.73 CUL-X (Browse shelf(Opens below)) | R (REFERENCE) | 7720 | |
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NISER LIBRARY | 548.73 CUL-X (Browse shelf(Opens below)) | Available | 7721 | |
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NISER LIBRARY | 548.73 CUL-X (Browse shelf(Opens below)) | Checked out to RUDRESH ACHARYA (0119) | 31/12/2022 | 7723 |
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| 548.7 STO-X X-ray structure determination: | 548.7 STO-X X-ray structure determination: | 548.73 BEN-U Understanding single-crystal x-ray crystallography | 548.73 CUL-X Elements of x-ray diffraction | 548.73 DON-F Fundamentals of x-ray crystallography | 548.73 GUI-X X-ray diffraction: in crystals, imperfect crystals and amorphous bodies | 548.73 HAM-B Basics of crystallography and diffraction |
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