Spectroscopic ellipsometry and reflectometry: a user's guide Harland G. Tompkins and William A. McGahan
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TextLanguage: English Publication details: New York Wiley 1999 Description: xiv,328pISBN: 9780471181729Subject(s): ELLIPSOMETRY | MATERIALS-OPTICAL PROPERTIES | REFLECTOMETRY | THIN FILMS-OPTICAL PROPERTIESDDC classification: 543.42
| Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 543.42 TOM-S (Browse shelf(Opens below)) | Available | 3739 |
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| 543.42 SOB-A Theory of atomic spectra | 543.42 SOB-A Theory of atomic spectra | 543.42 SVA-A Atomic and molecular spectoscopy: basic aspects and practical applications | 543.42 TOM-S Spectroscopic ellipsometry and reflectometry: a user's guide | 543.42 TOR-T Theoretical methods in fluorescence correlation spectroscopy | 543.42 TOR-T Theoretical methods in fluorescence correlation spectroscopy | 543.42 TOR-T Theoretical methods in fluorescence correlation spectroscopy |
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