Atomic force microscopy/sxcanning tunneling microscopy 2 edited by Samuel H. Cohen and Marcia L. Lightbody

By: Cohen, SHContributor(s): Lightbody, ML [Auth.]Material type: Text

TextLanguage: English Publication details: New York plenum 1997 Description: ix, 250pISBN: 9780306455964Subject(s): ATOMIC FORCE MICROSCOPOY | SCANNING TUNNELING MICROSCOPYDDC classification: 537.533.35

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	537.533.35 COH-A (Browse shelf(Opens below))	R (REFERENCE)		8522
Book	NISER LIBRARY	537.533.35 COH-A (Browse shelf(Opens below))	Available		8523

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