Electron microprobe analysis and scanning electron microscopy in geology
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TextLanguage: English Publication details: Singapore: Cambridge University Press, 2005 Edition: 2nd edDescription: xiii,190 p.; pbk.: 25 cmISBN: 9780521142304Subject(s): EARTH AND PLANETARY SCIENCE | ELECTRON MICROPROBE ANALYSIS | PHYSICSDDC classification: 537.533.35
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NISER LIBRARY | 537.533.35 REE-E (Browse shelf(Opens below)) | Available | 24046 | |
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Book
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NISER LIBRARY | 537.533.35 REE-E (Browse shelf(Opens below)) | Available | 23231 |
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| 537.533.35 MOR-N Noncontact atomic force microscopy: vol.2 | 537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis | 537.533.35 PEN-S Scanning Transmission Electron Microscopy:imaging and analysis | 537.533.35 REE-E Electron microprobe analysis and scanning electron microscopy in geology | 537.533.35 REE-E Electron microprobe analysis and scanning electron microscopy in geology | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations | 537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations |
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