In situ real time characterization of thin films

By: Edited by- Auciello, OrlandoContributor(s): Krauss, Alan RMaterial type: Text

TextLanguage: English Publication details: New York Wiley 2001 Description: xi, 263pISBN: 9780471241416Subject(s): THIN FLIMSDDC classification: 539.216

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	539.216 AUC-I (Browse shelf(Opens below))	Available		21017

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