Sem microcharacterization of semiconductors edited by D.B Holt and D.C.Joy
Material type:
TextLanguage: English Series: Techniques of physics:12Publication details: London Academic 1989 Description: xiii,452pISBN: 9780123538550Subject(s): ELECTRON BEAM | SEMICONDUCTOR DEVICES | TRANSIENT SPECTOSCOPYDDC classification: 537.311
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Book
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NISER LIBRARY | 537.311 HOL-S (Browse shelf(Opens below)) | R (REFERENCE) | 2665 |
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| 537.226 SID-D Domain structure in ferroelectrics and related materials | 537.311.322 TUR-Q Quantum dot(the): a journey into the future of microelectronics | 537.311.322 TUR-Q Quantum dot(the): a journey into the future of microelectronics | 537.311 HOL-S Sem microcharacterization of semiconductors | 537.5 RID-E Electrons and phonos in semiconductor multilayers | 537.5 RIM-I Ion implantation:Basic to device fabrication | 537.5 RIM-I Ion implantation:Basic to device fabrication |
vol.12
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