Transmission electron microscopy:a textbook for materials science

By: Williams, David BContributor(s): Carter, C. BarryMaterial type: Text

TextLanguage: English Publication details: New York Springer 2009 Edition: 2nd edDescription: lxii, 760p. pbkISBN: 9780387765006 Subject(s): PHYSICS | ELECTRON MICROSCOPYDDC classification: 537.533.35

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Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	537.533.35 WIL-T (Browse shelf(Opens below))	R (REFERENCE)		16893
Book	NISER LIBRARY	537.533.35 WIL-T (Browse shelf(Opens below))	Available		16894

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Previous	537.533.35 REE-E Electron microprobe analysis and scanning electron microscopy in geology	537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations	537.533.35 REI-F Fundamentals of atomic force microscopy,Part 1:Foundations	537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science	537.533.35 WIL-T Transmission electron microscopy:a textbook for materials science	537.533.35 WIL-T Transmission electron microscopy	537:535-2 SAS-E Electricity, magnetism and light	Next

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