Applied scanning probe methods VIII: scanning probe microscopy techniques Edited by B. Bhushan, H. Fuchs and M. Tomitori
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TextLanguage: English Series: Nanoscience and technolohyPublication details: Berlin Springer 2008 Description: xxx,465pISBN: 9783354740797Subject(s): SCANNING PROBE METHODSDDC classification: 620.3
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Book
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NISER LIBRARY | 620.3 BHU-A (Browse shelf(Opens below)) | R (REFERENCE) | 5898 |
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| 620.3 ASH-N Nanomaterials, nanotechnologies and design: an introduction for engineers and architects | 620.3 BAN-Q Quantum dots and nanowires | 620.3 BAN-Q Nanostructured materials and nanotechnology | 620.3 BHU-A Applied scanning probe methods VIII: scanning probe microscopy techniques | 620.3 BHU-H Springer handbook of nanotechnology | 620.3 BHU-S Handbook of nano-techonology | 620.3 BIC-C Computational nanoscience |
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