X-Ray Diffraction Crystallography
Material type:
Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2011. ISBN: 9783642166358, 978-3-642-16635-8Subject(s): Characterization and Evaluation of Materials | Crystallography | Crystallography | Engineering | Materials Science | Nanotechnology and Microengineering | Solid State Physics | Spectroscopy and Microscopy | Surfaces (Physics)DDC classification: 620.11, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
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NISER LIBRARY | 620.11, 23 (Browse shelf(Opens below)) | Available | E8039 |
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| 620.11, 23 Materials with Complex Behaviour:Modelling, Simulation, Testing, and Applications | 620.11, 23 Thermodynamics of Materials | 620.11, 23 Single-Sided NMR | 620.11, 23 X-Ray Diffraction Crystallography | 620.11, 23 Springer Handbook of Metrology and Testing | 620.11, 23 Supplementary Cementing Materials | 620.11, 23 Mechanics of Generalized Continua |
Chemistry and Materials Science (Springer-11644)
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