Optical Measurement of Surface Topography
Material type:
Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2011. ISBN: 9783642120121, 978-3-642-12012-1Subject(s): Microwaves, RF and Optical Engineering | Surfaces and Interfaces, Thin Films | Characterization and Evaluation of Materials | Materials Science | Measurement Science and Instrumentation | Microwaves | Surfaces (Physics)DDC classification: 620.11, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
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NISER LIBRARY | 620.11, 23 (Browse shelf(Opens below)) | Available | E7962 |
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| 620.11, 23 Electronic Structure and Magnetism of 3d-Transition Metal Pnictides | 620.11, 23 Heat Transfer in Multi-Phase Materials | 620.11, 23 Computer Methods in Mechanics | 620.11, 23 Optical Measurement of Surface Topography | 620.11, 23 Materials with Complex Behaviour:Modelling, Simulation, Testing, and Applications | 620.11, 23 Thermodynamics of Materials | 620.11, 23 Single-Sided NMR |
Chemistry and Materials Science (Springer-11644)
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