Noncontact Atomic Force Microscopy
Material type:
Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2009. ISBN: 9783642014956, 978-3-642-01495-6Subject(s): Engineering, general | Condensed Matter Physics | Engineering | Materials Science | Nanotechnology | NanotechnologyDDC classification: 620.115, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
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NISER LIBRARY | 620.115, 23 (Browse shelf(Opens below)) | Available | E7901 |
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| 620.115, 23 Ion Beams in Nanoscience and Technology | 620.115, 23 Nanoscale Phenomena | 620.115, 23 Nanotechnology in Construction 3 | 620.115, 23 Noncontact Atomic Force Microscopy | 620.115, 23 Nanowelded Carbon Nanotubes | 620.115, 23 Scanning Probe Microscopy in Nanoscience and Nanotechnology | 620.115, 23 Nanoneuroscience |
Chemistry and Materials Science (Springer-11644)
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