Ion Beams in Nanoscience and Technology
Material type:
Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2010. ISBN: 9783642006234, 978-3-642-00623-4Subject(s): Particle Acceleration and Detection, Beam Physics | Material Science | Materials | Measurement Science and Instrumentation | Nanotechnology | Nanotechnology | Particle acceleration | Solid State Physics | Spectroscopy and MicroscopyDDC classification: 620.115, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
|
NISER LIBRARY | 620.115, 23 (Browse shelf(Opens below)) | Available | E7887 |
Browsing NISER LIBRARY shelves Close shelf browser (Hides shelf browser)
| 620.115, 23 Applied Scanning Probe Methods XII | 620.115, 23 Nanoscience | 620.115, 23 Nanoscale Devices | 620.115, 23 Ion Beams in Nanoscience and Technology | 620.115, 23 Nanoscale Phenomena | 620.115, 23 Nanotechnology in Construction 3 | 620.115, 23 Noncontact Atomic Force Microscopy |
Chemistry and Materials Science (Springer-11644)
There are no comments on this title.