Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Material type:
Computer fileLanguage: English Publication details: New York, NY Springer New York 2011. ISBN: 9781441978172, 978-1-4419-7817-2Subject(s): Ceramics, Glass, Composites, Natural Methods | Chemistry, Physical organic | Atomic/Molecular Structure and Spectra | Materials | Materials Science | Microengineering | Microreactors | Physical Chemistry | Spectroscopy and Microscopy | Structural MaterialsDDC classification: 620.14, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
|
NISER LIBRARY | 620.14, 23 (Browse shelf(Opens below)) | Available | E7552 |
Browsing NISER LIBRARY shelves Close shelf browser (Hides shelf browser)
| 620.14, 23 Composite Materials | 620.14, 23 Fiberglass and Glass Technology | 620.14, 23 Principles of Solidification | 620.14, 23 Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces | 620.14, 23 Amorphous Chalcogenide Semiconductors and Related Materials | 620.14, 23 Fatigue of Fiber-reinforced Composites | 620.14, 23 Analysis of Failure in Fiber Polymer Laminates |
Chemistry and Materials Science (Springer-11644)
There are no comments on this title.