Scanning Transmission Electron Microscopy:imaging and analysis
Material type:
Computer fileLanguage: English Publication details: New York Springer 2011. Description: XII, 762p. hbkISBN: 9781441971999Subject(s): PHYSICS | Electron microscopyDDC classification: 537.533.35
| Item type | Current library | Call number | Status | Date due | Barcode |
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NISER LIBRARY | 537.533.35 PEN-S (Browse shelf(Opens below)) | R (REFERENCE) | 16891 | |
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NISER LIBRARY | 537.533.35 PEN-S (Browse shelf(Opens below)) | Available | 16892 | |
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NISER LIBRARY | 620.11295, 23 620.11297 23 (Browse shelf(Opens below)) | Available | E7541 |
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| 620.11295, 23 620.11297 23 Narrow Gap Semiconductors 2007 | 620.11295, 23 620.11297 23 Magnetic Oxides | 620.11295, 23 620.11297 23 TiO2 Nanotube Arrays | 620.11295, 23 620.11297 23 Scanning Transmission Electron Microscopy:imaging and analysis | 620.11295, 23 620.11297 23 Electronic Properties of Materials | 620.11295, 23 620.11297 23 Ferroelectrics in Microwave Devices, Circuits and Systems | 620.11295, 23 620.11297 23 Wide Bandgap Semiconductors |
Chemistry and Materials Science (Springer-11644)
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