Microscopy of Semiconducting Materials 2007
Material type:
Computer fileLanguage: English Publication details: Dordrecht Springer Netherlands 2008. ISBN: 9781402086151, 978-1-4020-8615-1Subject(s): Electronics and Microelectronics, Instrumentation | Materials Science, general | Measurement Science, Instrumentation | Electronics | Material Science | Materials | Particles (Nuclear physics) | Solid State Physics and Spectroscopy | Weights and measuresDDC classification: 620.11, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
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NISER LIBRARY | 620.11, 23 (Browse shelf(Opens below)) | Available | E7482 |
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| 620.11, 23 Safety Related Issues of Spent Nuclear Fuel Storage | 620.11, 23 Materials Chemistry | 620.11, 23 Safety, Reliability and Risks Associated with Water, Oil and Gas Pipelines | 620.11, 23 Microscopy of Semiconducting Materials 2007 | 620.11, 23 Carbon Nanomaterials in Clean Energy Hydrogen Systems | 620.11, 23 Sensors for Environment, Health and Security | 620.11, 23 Particle Size Measurements |
Chemistry and Materials Science (Springer-11644)
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