Search

Normal view MARC view ISBD view

Scanning Microscopy for Nanotechnology

Contributor(s): Zhou, Weilie., editorMaterial type:

Computer file

Computer fileLanguage: English Publication details: New York, NY Springer New York 2007. ISBN: 9780387396200, 978-0-387-39620-0Subject(s): Characterization and Evaluation of Materials | Chemistry | Chemistry | Measurement Science and Instrumentation | Nanotechnology | Nanotechnology | Optical and Electronic Materials | Optical materials | Surfaces (Physics)DDC classification: 620.115, Online resources: Click here to access online

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings ( 1 )
Title notes ( 1 )
Comments ( 0 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode
E(electronic)-Books	NISER LIBRARY	620.115, 23 (Browse shelf(Opens below))	Available		E7262

Chemistry and Materials Science (Springer-11644)

There are no comments on this title.

to post a comment.

© 2022 Copyright: Customised and Maintained by Central Library NISER

Central Library, NISER Library Building, PO-Jatni, Khurda, Odisha - 752050, India | ✉Email: libniser@niser.ac.in ☎Phone: +91-674-2494171

You Are OPAC Visitor No

free web counter

Powered by Koha