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Thin films analysis by x-ray scattering Mario Birkholz

By: Birkhoz, MarioContributor(s): Fewster, Paul F [Auth.]Material type: Text

TextLanguage: English Publication details: Weinheim Wiley 2006 Description: xxii,356pISBN: 978352731052Subject(s): FILM ANALYSIS | X RAY SCATTERINGDDC classification: 539.216:535.34

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Book	NISER LIBRARY	539.216:535.34 BIR-T (Browse shelf(Opens below))	Available		7913
Book	NISER LIBRARY	539.216:535.34 BIR-T (Browse shelf(Opens below))	Available		7914

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