Semiconductor Research
Material type:
Computer fileLanguage: English Publication details: Berlin, Heidelberg Springer Berlin Heidelberg 2012. ISBN: 9783642233517, 978-3-642-23351-7Subject(s): Optics, Optoelectronics, Plasmonics and Optical Devices | Computer engineering | Electrical Engineering | Measurement Science and Instrumentation | Optical and Electronic Materials | Optical materials | Physics | Physics | Semiconductors | Spectroscopy and MicroscopyDDC classification: 537.622, Online resources: Click here to access online
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
E(electronic)-Books
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NISER LIBRARY | 537.622, 23 (Browse shelf(Opens below)) | Available | E4197 |
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| 537.621 FIO-M Measurement and characterization of magnetic materials | 537.622, 23 The Physics of Semiconductors | 537.622, 23 Fowler-Nordheim Field Emission | 537.622, 23 Semiconductor Research | 537.622, 23 Semiconductor Modeling Techniques | 537.622, 23 Photomodulated Optical Reflectance | 537.622, 23 Topological Insulators |
Physics and Astronomy (Springer-11651)
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