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Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an)

Egerton, Ray E.

Physical principles of electron microscopy :Introduction to TEM,SEM and AEM (an) Ray E. Egerton - New York Springer 2008 - xii, 202p.

ISBN: 9780387258003

Subjects--Topical Terms:
ELECTRON MICROSCOPY
PHYSICAL PRINCIPLES
TEM SPECIMENS

Dewey Class. No.: 537.533.35 / EGE-P

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