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Scanning electron microscopy and x-ray microanalysis

Goldstein, Joseph I

Scanning electron microscopy and x-ray microanalysis - 4th ed. - New York: Springer, 2018. - xxiii, 550p. pb. 28cm.

ISBN: 9781493982691

Subjects--Topical Terms:
ELECTRON MICROSCOPY
X-RAY
PHYSICS
MICROSCOPE

Dewey Class. No.: 537.533.35 / GOL-S

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